Dr. Michael Pierce Profile

Dr. Michael Pierce

at Rochester Institute of Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 19 November 2021 Presentation + Paper

Tsion Teklemarim, Christopher Stolz, Matt Brophy, Michael Pierce, Pete Kupinski

Proceedings Volume 11910, 119100Y (2021) https://doi.org/10.1117/12.2599213

KEYWORDS: Oxygen, Aluminum, Absorption, Thin films, Water, Refractive index, Silica, Ultraviolet radiation, Resistance, Laser induced damage

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Keywords/Phrases