Dr. Michael T. Postek
at Univ of South Florida
SPIE Involvement:
Conference Program Committee | Author | Editor | Instructor
Publications (81)

Proceedings Article | 5 October 2018
Proc. SPIE. 10730, Nanoengineering: Fabrication, Properties, Optics, and Devices XV
KEYWORDS: Standards development, Medicine, Ultraviolet radiation, Manufacturing, Pathogens, Measurement devices, Reliability, Organisms, Systems modeling, Surgery

Proceedings Article | 5 October 2018
Proc. SPIE. 10730, Nanoengineering: Fabrication, Properties, Optics, and Devices XV
KEYWORDS: Polymers, Liquids, Molecules, Dynamic light scattering, Particles, Nanomaterials, Light scattering, Transmission electron microscopy, Nanoparticles

Proceedings Article | 31 August 2017
Proc. SPIE. 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
KEYWORDS: Ionizing radiation, Manufacturing, Nanomaterials, Standards development, Composites, Metrology, Nanocrystals, Polymers, Crystals, Carbon monoxide

SPIE Journal Paper | 15 December 2016
JM3 Vol. 15 Issue 04
KEYWORDS: Metrology, Scanning electron microscopy, Atomic force microscopy, Error analysis, Calibration, 3D metrology, Image segmentation, Optical proximity correction, Lithography, Composites

Proceedings Article | 15 September 2016
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Scanning electron microscopy, Signal to noise ratio, Metrology, Photomicroscopy, Signal detection, Interference (communication), Electron beams, Image acquisition, Image quality, Image processing

Showing 5 of 81 publications
Proceedings Volume Editor (22)

Showing 5 of 22 publications
Conference Committee Involvement (48)
Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII
24 August 2020 | Online Only, California, United States
Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVI
11 August 2019 | San Diego, California, United States
Nanoengineering: Fabrication, Properties, Optics, and Devices XV
21 August 2018 | San Diego, California, United States
Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
9 August 2017 | San Diego, California, United States
Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
30 August 2016 | San Diego, California, United States
Showing 5 of 48 Conference Committees
Course Instructor
SC105: CD Metrology and Image Formation in the Scanning Electron Microscope (SEM)
The scanning electron microscope (SEM) is used extensively in semiconductor production as a measurement tool for inspection and critical dimension (CD) metrology. Improved images and measurements can be obtained and interpreted better by studying the details of the image-formation process. Non-mathematical explanations of the basic principles will allow the participant to get the best possible information from the specimen. There is also a discussion of how to get the most accurate measurements with this instrument.
SC954: Scanning Microscopy in Forensic Science
This one day short course will be devoted to the use of scanning microscopies including scanning electron microscopy (SEM), scanning optical profilometry, and energy dispersive x-ray (EDS) and x-ray fluorescence (XRF) spectrometry to forensic sample analyses including counter terrorism, explosives, pyrotechnics, counterfeit drugs and food and product tampering. The course is presented in four sections. Section one will provide the students with an understanding of the value and pitfalls of relying on instrument software in the examination of varying samples types and analysis conditions. Emphasis will be place on issues of instrument quality assurance including calibration, operation and understanding your instrument's data and compliance with certification organizations including ISO and ASCLD/LAB. Section two will be devoted to a presentation of sample handling and preparation as well as "unknown white powder" case analyses and other cases involving counterfeit drugs, food and product tampering. Section three will cover the issues of gunshot residue (GSR) analysis and more "unknown white powder" analyses related to pyrotechnic devices and flares as well as a presentation on improvised acid/foil bombs. Section four will include additional approaches to the analyses of "unknown white powder" cases so common today, the capabilities of a forensic laboratory in supporting emergency responders, and a number of illustrative case histories. Additional topics may cover a Scientific Working Group on Gun Shot Residue (SWGGSR) update report and perspective on instant shooter GSR kits. This course will be jointly presented by four instructors, all recognized experts in their respective area of scanning microscopy and applications to forensic science.
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top