Dr. Michael Reiter
at Sony DADC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 April 2001
Proc. SPIE. 4301, Machine Vision Applications in Industrial Inspection IX
KEYWORDS: Principal component analysis, Statistical analysis, Error analysis, 3D modeling, Feature extraction, Performance modeling, Solid modeling, 3D image processing, Canonical correlation analysis, Simulation of CCA and DLA aggregates

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