Mr. Michael Schardt
at Technical University of Munich
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 5, 2017
Proc. SPIE. 10210, Next-Generation Spectroscopic Technologies X
KEYWORDS: Microbolometers, Thermography, Optical components, Fourier spectroscopy, Refractive index, Beam splitters, FT-IR spectroscopy, Data modeling, Sensors, Spectroscopy, Spectrometers, Fourier transforms, Infrared spectroscopy, Detector arrays, Infrared radiation, Spectrometer engineering, Temperature metrology

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017
KEYWORDS: Hyperspectral imaging, Thin films, Reflection, Imaging systems, Polymers, Reflectivity, Computer simulations, Reflectometry, Neural networks, Neurons

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Beam splitters, Imaging systems, Sensors, Image processing, Luminescence, Image resolution, Image filtering, Aluminum, 3D image processing, Bandpass filters

SPIE Journal Paper | August 13, 2013
OE Vol. 52 Issue 10
KEYWORDS: Calibration, Surface roughness, Visibility, Data analysis, Radium, Speckle, Speckle interferometry, Statistical modeling, Data modeling, Optical engineering

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