Michael Schardt
at Technical University of Munich
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 5, 2017
Proc. SPIE. 10210, Next-Generation Spectroscopic Technologies X
KEYWORDS: Temperature metrology, Sensors, Beam splitters, Optical components, Refractive index, Spectrometer engineering, Data modeling, Spectrometers, Fourier transforms, Infrared spectroscopy, Spectroscopy, Thermography, Infrared radiation, Microbolometers, Detector arrays, FT-IR spectroscopy, Fourier spectroscopy

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017
KEYWORDS: Neural networks, Thin films, Imaging systems, Hyperspectral imaging, Neurons, Reflectometry, Polymers, Computer simulations, Reflectivity, Reflection

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Luminescence, Image filtering, Bandpass filters, Image resolution, Beam splitters, Sensors, Aluminum, Imaging systems, Image processing, 3D image processing

SPIE Journal Paper | August 13, 2013
OE Vol. 52 Issue 10
KEYWORDS: Calibration, Surface roughness, Visibility, Data analysis, Radium, Speckle, Speckle interferometry, Statistical modeling, Data modeling, Optical engineering

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