Dr. Michael Schulz
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Conference Program Committee | Author
Publications (43)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical imaging, Optical components, Metrology, Interferometers, Manufacturing, Interferometry, Quality measurement, Optical testing, Ray tracing, Aspheric lenses, Optical simulations, Surface finishing

PROCEEDINGS ARTICLE | June 15, 2017
Proc. SPIE. 10326, Fourth European Seminar on Precision Optics Manufacturing
KEYWORDS: Mirrors, Metrology, Optical testing, Deflectometry, Autocollimators, Synchrotrons

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Actuators, Mirrors, Beam splitters, Spatial frequencies, Sensors, Interferometry, Control systems, Deflectometry, Image sensors, Autocollimators

PROCEEDINGS ARTICLE | June 30, 2016
Proc. SPIE. 10009, Third European Seminar on Precision Optics Manufacturing
KEYWORDS: Mirrors, Interferometers, Sensors, Manufacturing, Interferometry, Optical testing, Deflectometry, Geometrical optics, Optics manufacturing, Fizeau interferometers

SPIE Journal Paper | March 16, 2016
OE Vol. 55 Issue 07
KEYWORDS: Spherical lenses, Freeform optics, Calibration, Metrology, Optical spheres, Copper, Optics manufacturing, Interferometry, Wavefronts, Interferometers

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Metrology, Optical spheres, Interferometers, Calibration, Interferometry, Optical testing, Aspheric lenses, Optical benches, Inverse optics, Temperature metrology

Showing 5 of 43 publications
Conference Committee Involvement (4)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2 August 2005 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
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