Dr. Michael J. Theisen
Optical Engineer at L3 Sonoma EO
SPIE Involvement:
Author
Publications (7)

SPIE Journal Paper | May 4, 2018
OE Vol. 57 Issue 05
KEYWORDS: Sensors, Infrared search and track, Signal to noise ratio, Long wavelength infrared, Mid-IR, Staring arrays, Target detection, Infrared sensors, Photons, Signal detection

PROCEEDINGS ARTICLE | May 4, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Infrared search and track, Long wavelength infrared, Signal to noise ratio, Infrared sensors, Mid-IR, Point spread functions, Sensors, Optimization (mathematics), Performance modeling, Systems modeling

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Mid-IR, Optical filters, Imaging systems, Imaging systems, Spatial frequencies, Image processing, Wavefronts, Image quality, Modulation transfer functions, Thermal modeling, Thermal modeling, Systems modeling, Systems modeling

PROCEEDINGS ARTICLE | April 2, 2014
Proc. SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII
KEYWORDS: Semiconductors, Oxides, Polarization, Scattering, Light scattering, Scatterometry, Signal processing, Quantum mechanics, Polarization control, Scatter measurement

PROCEEDINGS ARTICLE | March 12, 2014
Proc. SPIE. 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
KEYWORDS: Beam splitters, Optical spheres, Polarization, Interferometers, Crystals, Wave plates, Polarimetry, Spatial light modulators, Calcite, Polarization control

PROCEEDINGS ARTICLE | March 12, 2014
Proc. SPIE. 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
KEYWORDS: Semiconductors, Oxides, Metrology, Polarization, Scattering, Light scattering, Laser scattering, Scatterometry, Critical dimension metrology, Dielectric polarization

Showing 5 of 7 publications
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