Dr. Michael M. J. Treacy
at NEC Research Institute Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 9, 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Chemical species, Scattering, Silicon, Microscopy, Diffraction, Crystals, Transmission electron microscopy, Data modeling, Image resolution, Speckle

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