Dr. Michael Wojcik
Postdoctoral Researcher at Argonne National Lab
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Diffraction, Monochromatic aberrations, Mirrors, Sensors, Crystals, X-rays, Wavefront sensors, Wavefronts, Adaptive optics, Optical alignment, Hard x-rays

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Coherence imaging, Capillaries, X-rays, X-ray diffraction, Data acquisition, Reconstruction algorithms, Monochromators, X-ray imaging

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Diffraction, Synchrotron radiation instrumentation, Microscopy, Interferometry, Phase retrieval, X-ray imaging

Proceedings Article | 19 September 2017 Presentation
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Microscopes, Nanoimaging, Interferometry, Nanoprobes, Data acquisition, Spatial resolution, Zone plates, Hard x-rays

Proceedings Article | 7 September 2017 Presentation + Paper
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Gold, X-ray optics, Sputter deposition, X-rays, Interfaces, Image transmission, Charge-coupled devices, Zone plates, Monochromators, Phase shifts

Showing 5 of 11 publications
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