Dr. Michael Zawisky
at Technische Univ Wien
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 September 2008
Proc. SPIE. 7080, Penetrating Radiation Systems and Applications IX
KEYWORDS: Sensors, Scintillators, Radiography, Inspection, Nondestructive evaluation, CCD cameras, Tomography, Image sensors, Scintillation, Beryllium

Proceedings Article | 7 January 2002
Proc. SPIE. 4503, Developments in X-Ray Tomography III
KEYWORDS: Phase contrast, Scattering, Interferometers, Sensors, Signal attenuation, Crystals, X-rays, Tomography, Phase shifts, Absorption

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