Michael J. Zemlan
Sales Representative at Andor Technology Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 May 2016
Proc. SPIE. 9840, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII
KEYWORDS: Hyperspectral imaging, Veins, Visualization, Imaging systems, Image processing, Reflectivity, Data acquisition, Machine learning, Image classification, Binary data

Proceedings Article | 1 September 2015
Proc. SPIE. 9611, Imaging Spectrometry XX
KEYWORDS: Packaging, Hyperspectral imaging, Near infrared, Imaging systems, Image segmentation, Image processing, Data acquisition, Image classification, Scene classification, Binary data

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top