Dr. Michal Bodnar
at TESLA Blatná as
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 28 August 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Signal to noise ratio, CMOS sensors, Metrology, Sensors, Crystals, Interferometry, Interferometry, Nondestructive evaluation, Nondestructive evaluation, Interference (communication), Laser crystals, Electromagnetism

SPIE Journal Paper | 1 January 2011
JNP Vol. 5 Issue 01
KEYWORDS: Aluminum, Thin films, Plasma, Nanostructured thin films, Argon, Nanostructuring, Nanostructures, Data modeling, Sputter deposition, Optical properties

Proceedings Article | 24 August 2010
Proc. SPIE. 7766, Nanostructured Thin Films III
KEYWORDS: Oxides, Nanostructuring, Data modeling, Silica, Optical properties, Metals, Silver, Reflectivity, Scanning electron microscopy, Deposition processes

Proceedings Article | 24 August 2010
Proc. SPIE. 7766, Nanostructured Thin Films III
KEYWORDS: Thin films, Nanostructures, Nanostructuring, Data modeling, Optical properties, Sputter deposition, Emission spectroscopy, Aluminum, Nanolithography, Plasma

Proceedings Article | 1 April 2010
Proc. SPIE. 7647, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2010
KEYWORDS: Signal to noise ratio, Sensors, Crystals, X-rays, Nondestructive evaluation, Interference (communication), Image sensors, Laser crystals, Electromagnetism, 3D image processing

Showing 5 of 8 publications
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