Michal M. Nawrot
at Univ of Warsaw
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Microscopes, Refractive index, Holography, Two photon polymerization, Digital holography, Polymers, Tomography, Printing, 3D metrology, Phase measurement

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