Dr. Michel Vilain
SPIE Involvement:
Publications (26)

Proceedings Article | 21 November 2017 Open Access Paper
Proceedings Volume 10569, 1056902 (2017) https://doi.org/10.1117/12.2307954
KEYWORDS: Amorphous silicon, Sensors, Microbolometers, Bolometers, Resistance, Reliability, Signal to noise ratio, Infrared radiation, Silicon, Staring arrays

SPIE Journal Paper | 1 June 2011
Jean-Luc Tissot, Sébastien Tinnes, Alain Durand, Cristophe Minassian, Patrick Robert, Michel Vilain, Jean-Jacques Yon
OE, Vol. 50, Issue 06, 061006, (June 2011) https://doi.org/10.1117/12.10.1117/1.3572155
KEYWORDS: Amorphous silicon, Sensors, Staring arrays, Microbolometers, Video, Visualization, Infrared radiation, Temperature metrology, Readout integrated circuits, Analog electronics

Proceedings Article | 21 May 2011 Paper
A. Durand, J.L. Tissot, P. Robert, S. Cortial, C. Roman, M. Vilain, O. Legras
Proceedings Volume 8012, 80121C (2011) https://doi.org/10.1117/12.888095
KEYWORDS: Amorphous silicon, Sensors, Microbolometers, Temperature metrology, Readout integrated circuits, Packaging, Sun, Electro optics, Interfaces, Resistance

Proceedings Article | 28 October 2010 Paper
J. Tissot, S. Tinnes, A. Durand, C. Minassian, P. Robert, M. Vilain
Proceedings Volume 7834, 78340K (2010) https://doi.org/10.1117/12.864867
KEYWORDS: Sensors, Amorphous silicon, Microbolometers, Temperature metrology, Video, Readout integrated circuits, Analog electronics, Bolometers, Imaging systems, Electro optics

Proceedings Article | 4 May 2010 Paper
J. Tissot, A. Durand, Th. Garret, C. Minassian, P. Robert, S. Tinnes, M. Vilain
Proceedings Volume 7660, 76600T (2010) https://doi.org/10.1117/12.853063
KEYWORDS: Sensors, Amorphous silicon, Temperature metrology, Microbolometers, Video, Analog electronics, Readout integrated circuits, Electro optics, Bolometers, Infrared sensors

Showing 5 of 26 publications
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