Dr. Mihiro Yanagihara Profile

Dr. Mihiro Yanagihara

at Tohoku Univ

SPIE Involvement:

Author

Proceedings Article | 8 November 2000 Paper

Varied-line-spacing laminar-type holographic grating for the standard soft x-ray flat-field spectrograph

Masato Koike, Takeshi Namioka, Eric Gullikson, Yoshihisa Harada, Sadayuki Ishikawa, Takashi Imazono, Stanley Mrowka, Noboru Miyata, Mihiro Yanagihara, James Underwood, Kazuo Sano, Tokuo Ogiwara, Osamu Yoda, Shiro Nagai

Proceedings Volume 4146, (2000) https://doi.org/10.1117/12.406669

KEYWORDS: Holography, Spectrographs, Optical design, X-rays, Diffraction gratings, Aspheric lenses, Diffraction, Spherical lenses, Spectral resolution, Reactive ion etching

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Proceedings Article | 9 June 2000 Paper

Monitoring of Hakucho Suspension Bridge by ambient vibration measurement

Masato Abe, Yozo Fujino, Mihiro Yanagihara, Masashi Sato

Proceedings Volume 3995, (2000) https://doi.org/10.1117/12.387815

KEYWORDS: Bridges, Vibrometry, Information operations, Statistical analysis, Data processing, Environmental sensing, Motion measurement, Velocity measurements, Wind measurement, Civil engineering

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Proceedings Article | 16 August 1996 Paper

Polarization studies on the B 1s exciton emission from h-BN using a soft x-ray multilayer polarizer

Noboru Miyata, Mihiro Yanagihara, Minaji Furudate, T. Ejima, Makoto Watanabe

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246190

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Proceedings Article | 16 August 1996 Paper

First thin film ellipsometry at a photon energy of 97eV with use of high-performance multilayer polarizers

Masaki Yamamoto, K. Mayama, Hidekazu Kimura, Minaji Furudate, Mihiro Yanagihara

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246183

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SPIE Journal Paper | 1 February 1995

High heat load vacuum ultraviolet mirror development in Japan

Shigeru Sato, Hideki Maezawa, Mihiro Yanagihara, Eiji Ishiguro, Shu-itsu Matsuo

OE, Vol. 34, Issue 02, (February 1995) https://doi.org/10.1117/12.10.1117/12.194832

KEYWORDS: Mirrors, Silicon carbide, Chemical vapor deposition, Vacuum ultraviolet, Reflectivity, X-rays, Copper, Multilayers, Profilometers, Coating

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Proceedings Article | 25 February 1993 Paper

Test of holographic SiC gratings for high-power synchrotron radiation

Eiji Ishiguro, Hideki Maezawa, Makoto Sakurai, Mihiro Yanagihara, Makoto Watanabe, Masaru Koeda, Tetsuya Nagano, Kazuo Sano, Yasuhiro Akune, Kichiya Tanino

Proceedings Volume 1739, (1993) https://doi.org/10.1117/12.140515

KEYWORDS: Silicon carbide, Diffraction gratings, Gold, Etching, Diffraction, Chemical vapor deposition, Argon, Photoresist materials, Heat flux, Thermal engineering

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Proceedings Article | 25 February 1993 Paper

Calorimetric measurements of power distribution in multipole-wiggler radiation

Mihiro Yanagihara, Yoshinori Goto, Seiji Asaoka, Hideki Maezawa, Hidenao Sugawara

Proceedings Volume 1739, (1993) https://doi.org/10.1117/12.140542

KEYWORDS: Copper, Temperature metrology, Solids, Beryllium, Synchrotron radiation, Optical components, Heat flux, Thermal engineering, Distance measurement, Mirrors

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Proceedings Article | 25 February 1993 Paper

Stability tests for soft x-ray multilayers under exposure to multipole-wiggler radiation

Mihiro Yanagihara, Kou Mayama, Seiji Asaoka, Hideki Maezawa

Proceedings Volume 1739, (1993) https://doi.org/10.1117/12.140517

KEYWORDS: Reflectivity, Annealing, Sputter deposition, Solids, X-rays, Silicon carbide, Multilayers, Silicon, Thermal effects, Heat flux

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Proceedings Article | 25 February 1993 Paper

Beryllium window and graphite filter assemblies for high heat flux synchrotron radiation beamlines at the Photon Factory

Hideki Maezawa, Seiji Asaoka, Mihiro Yanagihara, Yukihide Kamiya

Proceedings Volume 1739, (1993) https://doi.org/10.1117/12.140497

KEYWORDS: Beryllium, Optical filters, Heat flux, Thermal engineering, Absorption, Synchrotron radiation, Absorption filters, X-rays, Thermal modeling, Failure analysis

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Proceedings Article | 20 October 1992 Paper

Design, fabrication, and polarization of soft x-ray transmission multilayers

Hiroshi Nomura, Kou Mayama, Takuya Sasaki, Masaki Yamamoto, Mihiro Yanagihara

Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132147

KEYWORDS: Polarization, Transmittance, Multilayers, Phase shifts, Reflectivity, Polarizers, Silicon, Reflection, Photon polarization, Molybdenum

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Proceedings Article | 20 October 1992 Paper

Soft x-ray polarization measurement with a laboratory reflectometer

Masaki Yamamoto, Kou Mayama, Hiroshi Nomura, Hiroaki Kimura, Mihiro Yanagihara, Takeshi Namioka

Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132146

KEYWORDS: Polarization, Phase shifts, Reflectometry, Polarizers, Monochromators, Sensors, Plasma, Phase measurement, Signal analyzers, Wave plates

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Proceedings Article | 20 October 1992 Paper

Thickness dependence of the optical constants of thin Pt, Au, and Rh films in the soft x-ray region

Mihiro Yanagihara, Takaumi Maehara, Masaki Yamamoto, Takeshi Namioka

Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132131

KEYWORDS: Gold, Platinum, Rhodium, Reflectivity, X-rays, Multilayers, Glasses, Thin films, Ion beams, Sputter deposition

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SPIE Journal Paper | 1 August 1991

Soft X-ray multilayers fabricated by electron-beam deposition

Masaaki Sudoh, Ryouhei Yokoyama, Mitsuo Sumiya, Masaki Yamamoto, Mihiro Yanagihara, Takeshi Namioka

OE, Vol. 30, Issue 08, (August 1991) https://doi.org/10.1117/12.10.1117/12.55908

KEYWORDS: Reflectivity, X-rays, Temperature metrology, Multilayers, X-ray diffraction, Silicon, Molybdenum, Photomicroscopy, Radiation effects, Transmission electron microscopy

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Proceedings Article | 1 February 1991 Paper

Soft x-ray multilayers fabricated by electron-beam deposition

Masaaki Sudoh, Ryouhei Yokoyama, Mitsuo Sumiya, Masaki Yamamoto, Mihiro Yanagihara, Takeshi Namioka

Proceedings Volume 1343, (1991) https://doi.org/10.1117/12.23173

KEYWORDS: X-rays, Temperature metrology, Reflectivity, X-ray diffraction, Silicon, X-ray astronomy, Molybdenum, Astronomy, Microscopy, Photomicroscopy

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Showing 5 of 14 publications

Conference Committee Involvement (1)

Optical Constants of Materials for UV to X-Ray Wavelengths

4 August 2004 | Denver, Colorado, United States

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