Dr. Mihiro Yanagihara
at Tohoku Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | November 8, 2000
Proc. SPIE. 4146, Soft X-Ray and EUV Imaging Systems
KEYWORDS: Diffraction, Spectrographs, Optical design, Holography, X-rays, Spectral resolution, Aspheric lenses, Reactive ion etching, Spherical lenses, Diffraction gratings

PROCEEDINGS ARTICLE | June 9, 2000
Proc. SPIE. 3995, Nondestructive Evaluation of Highways, Utilities, and Pipelines IV
KEYWORDS: Statistical analysis, Data processing, Vibrometry, Civil engineering, Bridges, Velocity measurements, Motion measurement, Environmental sensing, Wind measurement, Information operations

PROCEEDINGS ARTICLE | August 16, 1996
Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

PROCEEDINGS ARTICLE | August 16, 1996
Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

SPIE Journal Paper | February 1, 1995
OE Vol. 34 Issue 02
KEYWORDS: Mirrors, Silicon carbide, Chemical vapor deposition, Vacuum ultraviolet, Reflectivity, X-rays, Copper, Multilayers, Profilometers, Coating

PROCEEDINGS ARTICLE | February 25, 1993
Proc. SPIE. 1739, High Heat Flux Engineering
KEYWORDS: Optical components, Mirrors, Copper, Distance measurement, Solids, Synchrotron radiation, Heat flux, Beryllium, Thermal engineering, Temperature metrology

Showing 5 of 14 publications
Conference Committee Involvement (1)
Optical Constants of Materials for UV to X-Ray Wavelengths
4 August 2004 | Denver, Colorado, United States
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