Dr. Mikhail A. Antimonov
at Univ of Illinois at Chicago
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | November 14, 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Mirrors, Multilayers, Error analysis, Crystals, X-rays, Coating, Reflectivity, Laser crystals, Heat flux, Monochromators

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X
KEYWORDS: Data modeling, Scattering, Polymers, X-rays, Chromium, 3D modeling, Finite element methods, Beryllium, Atmospheric modeling, Temperature metrology

PROCEEDINGS ARTICLE | October 3, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Diffraction, Refractive index, Prisms, X-ray optics, Statistical analysis, X-rays, Silicon, Colorimetry, Alternate lighting of surfaces, Absorption

PROCEEDINGS ARTICLE | October 8, 2013
Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII
KEYWORDS: Prisms, Teeth, Lenses, X-rays, Silicon, Manufacturing, Collimation, Chemical elements, Commercial off the shelf technology, Alternate lighting of surfaces

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