Dr. Mikhail Gubarev
Astrophysicist at NASA Marshall Space Flight Ctr
SPIE Involvement:
Conference Program Committee | Author
Publications (81)

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10397, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX
KEYWORDS: Calibration, Mirrors, Space telescopes, X-ray detectors, Telescopes, X-ray telescopes, X-rays, Sensors, Astronomy, Astronomical telescopes

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: X-ray telescopes, Mirrors, Coating, X-ray optics, Silicon, Ion implantation, X-rays, Thin films, Ions, Iridium

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Active optics, Optics manufacturing, X-ray optics, Finite element methods, X-ray telescopes, Adaptive optics, Spatial resolution, Actuators, Optical mounts, Switches

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Space telescopes, X-rays, Telescopes, Mirrors, Cameras, X-ray telescopes, Fermium, Frequency modulation, Scattering, X-ray astronomy

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Polishing, X-ray optics, Mirrors, Surface finishing, Beryllium, Fabrication, Polishing equipment, Aluminum, Beryllium, X-rays, Metals

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Rockets, X-ray optics, Sun, Sensors, Solar energy, Silicon, X-ray optics, Electrons, Mirrors, Solar processes, Target detection

Showing 5 of 81 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Showing 5 of 6 published special sections
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