Dr. Mikhail Gubarev
Astrophysicist at NASA Marshall Space Flight Ctr
SPIE Involvement:
Conference Program Committee | Author
Publications (81)

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10397, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX
KEYWORDS: Telescopes, Mirrors, Astronomy, Sensors, Calibration, X-rays, Space telescopes, Astronomical telescopes, X-ray telescopes, X-ray detectors

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Thin films, Mirrors, X-ray optics, X-rays, Ions, Silicon, Coating, Ion implantation, X-ray telescopes, Iridium

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Actuators, X-ray optics, Switches, Adaptive optics, Finite element methods, Spatial resolution, X-ray telescopes, Active optics, Optical mounts, Optics manufacturing

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Telescopes, Mirrors, Scattering, Cameras, X-rays, Space telescopes, Frequency modulation, Fermium, X-ray astronomy, X-ray telescopes

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Fabrication, Mirrors, X-ray optics, Polishing, Polishing equipment, Metals, X-rays, Aluminum, Beryllium, Beryllium, Surface finishing

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Target detection, Mirrors, Rockets, X-ray optics, X-ray optics, Solar energy, Sun, Sensors, Electrons, Silicon, Solar processes

Showing 5 of 81 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Showing 5 of 6 published special sections
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