In recent years, ptychography has revolutionized x-ray microscopy in that it is able to overcome the diffraction limit of x-ray optics, pushing the spatial resolution limit down to a few nanometers. However, due to the weak interaction of x rays with matter, the detection of small features inside a sample requires a high coherent fluence on the sample, a high degree of mechanical stability, and a low background signal from the x-ray microscope. The x-ray scanning microscope PtyNAMi at PETRA III is designed for high-spatial-resolution 3D imaging with high sensitivity. The design concept is presented with a special focus on real-time metrology of the sample position during tomographic scanning microscopy.
We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses. The
main concept of new interferometer is based on the same principle such a bilens interferometer. The interference fringe
pattern produced by the multilens interferometer was described by Talbot imaging formalism. A theoretical analysis of
the interference pattern formation was carried out and corresponding computer simulations were performed. The
proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10
to 30 keV. Experimentally recorded fractional Talbot images are in a good agreement with computer calculations.