Dr. Miklos Fried
at MTA MFA
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 3 March 2022 Paper
Proceedings Volume 11977, 1197706 (2022) https://doi.org/10.1117/12.2609814
KEYWORDS: Silicon, Nanoparticles, Gold, Nanorods, Glasses, Particles, Plasmonics, Thin films, Semiconducting wafers, Silicon films

Proceedings Article | 2 March 2022 Poster + Paper
Proceedings Volume 11972, 119720G (2022) https://doi.org/10.1117/12.2609882
KEYWORDS: Gold, Glasses, Optical properties, Interfaces, Silicon, Refractive index, Nanoparticles, Thin films, Nanorods, Molecules

Proceedings Article | 22 June 2015 Paper
P. Petrik, E. Agocs, B. Kalas, P. Kozma, B. Fodor, J. Nador, C. Major, M. Fried
Proceedings Volume 9529, 95290W (2015) https://doi.org/10.1117/12.2184850
KEYWORDS: Gold, Ellipsometry, Glasses, Adsorption, Plasmons, Spectroscopy, Interfaces, Reflectance spectroscopy, Plasmonics, Resonance enhancement

Proceedings Article | 22 June 2015 Paper
M. Fried, C. Major, G. Juhasz, P. Petrik, Z. Horvath
Proceedings Volume 9525, 95251S (2015) https://doi.org/10.1117/12.2184713
KEYWORDS: Photovoltaics, Thin films, Zinc oxide, Amorphous silicon, Calibration, Solar cells, Time metrology, Dielectrics, Spectroscopic ellipsometry, Ellipsometry

Proceedings Article | 21 June 2015 Paper
P. Petrik, B. Fodor, E. Agocs, P. Kozma, J. Nador, N. Kumar, J. Endres, G. Juhasz, C. Major, S. Pereira, T. Lohner, H. P. Urbach, B. Bodermann, M. Fried
Proceedings Volume 9526, 95260S (2015) https://doi.org/10.1117/12.2184833
KEYWORDS: Ellipsometry, Scatterometry, Spectroscopy, Spectroscopic ellipsometry, Thin films, Solids, Silicon, Applied physics, Semiconductors, Atomic force microscopy

Showing 5 of 17 publications
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