Min-Chul Kwon
at Kyungnam Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 12 November 2010
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Light sources, Imaging systems, Cameras, Calibration, Image processing, CCD cameras, Collimation, Lens grinding equipment, Tolerancing, Precision calibration

Proceedings Article | 24 November 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Photovoltaics, Telescopes, Mirrors, Interferometers, Sensors, 3D metrology, Profilometers, Aspheric lenses, Data centers, Mechanical engineering

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Ferroelectric materials, Coherence (optics), Interferometers, Sensors, Interferometry, Wavefronts, Distance measurement, 3D metrology, Objectives, Aspheric lenses

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