We investigated resonant light scattering properties of single wavelength-scale metallic or dielectric nanorods in the energy-momentum space. High-refractive-index silicon nanostructures supporting strong Mie resonances allow light manipulation beyond the optical diffraction limit. Based on dark-field microscopy and numerical modal analysis, we revealed that the waveguide dispersion of the silicon nanorod determines and controls the resonant scattering properties. We also demonstrated for the first time quantitative measurement of the differential far-field scattering cross-section of a single metal nanostructure over the full hemisphere. While conventional back-focal-plane imaging suffers from optical aberration/distortion and numerical aperture limit of the objective lens, goniometer-based direct solid angle scanning provides quantitative and flawless information of far-field scattering from nanostructures on the wavelength scale or less.
We propose and demonstrate a metal-dielectric thin film that delivers low reflection and high absorption over the entire
visible spectrum. This thin black film consists of SiO<sub>2</sub>/Cr/SiO<sub>2</sub>/Al layers deposited on glass substrate. Measured
reflectance and absorptance of the black film are 0.7% and 99.3%, respectively, when averaged over the range 380-780
nm. The total thickness of the black film is only about 220 nm. This thin black film can be used as a thin absorbing layer
for displays that require both broadband anti-reflection and high contrast characteristics.
Lasing dynamics of photonic-crystal single-cell cavity is studied by Lorentz-dispersive Gain FDTD method. From hexapole mode of a photonic-crystal single-cell cavity, the generation of laser modes and the relaxation oscillation are observed.