Mr. Ming Liu
at Univ of Rhode Island
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 17, 2005
Proc. SPIE. 5764, Smart Structures and Materials 2005: Smart Structures and Integrated Systems
KEYWORDS: Signal to noise ratio, Safety, Mechanics, Complex systems, Reliability, Numerical simulations, Data processing, Dynamical systems, Mechanical engineering, System on a chip

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