Mrs. Miri Kish-Dagan
VP R&D at Raicol Crystals Ltd
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | March 27, 2007
Proc. SPIE. 6520, Optical Microlithography XX
KEYWORDS: Oxides, CMOS sensors, Phase modulation, Metals, Data transmission, Image sensors, Optical alignment, Scanning probe microscopy, Semiconducting wafers, Overlay metrology

PROCEEDINGS ARTICLE | April 29, 2004
Proc. SPIE. 5378, Data Analysis and Modeling for Process Control
KEYWORDS: Semiconductors, Metrology, Data modeling, Phase modulation, Manufacturing, Control systems, Process control, Feedback control, Semiconducting wafers, Overlay metrology

PROCEEDINGS ARTICLE | April 29, 2004
Proc. SPIE. 5378, Data Analysis and Modeling for Process Control
KEYWORDS: Semiconductors, Lithography, Manufacturing, Control systems, Nomenclature, Process control, Information technology, System integration, Semiconducting wafers, Overlay metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top