Miss Miriam Moreno-Moreno
at Univ Autónoma de Madrid
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 9, 2012
Proc. SPIE. 8362, Passive and Active Millimeter-Wave Imaging XV
KEYWORDS: Extremely high frequency, Biometrics, Data modeling, Imaging systems, Databases, Image segmentation, 3D modeling, Feature extraction, Feature selection, Systems modeling

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