Dr. Mirza Cevro
Senior Process Scientist
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 February 1995
OE Vol. 34 Issue 02
KEYWORDS: Tantalum, Refractive index, Argon, Ions, Oxides, Sputter deposition, Oxygen, Thin films, Deposition processes, Ion beams

Proceedings Article | 4 November 1994
Proc. SPIE. 2253, Optical Interference Coatings
KEYWORDS: Oxides, Thin films, Refractive index, Argon, Sputter deposition, Ions, Oxygen, Ion beams, Deposition processes, Tantalum

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