Prof. Mitsuo Takeda
SPIE Involvement:
Author | Visiting Lecturer
Area of Expertise:
Optical Metrology , Holography and Optical Information Processing , Imaging and Fourier Optics , Signal and Image Processing
Profile Summary

Mitsuo Takeda is Professor of Center for Optical Research and Education at Utsunomiya University, and Professor Emeritus of the University of Electro-Communications (UEC), Tokyo, Japan.

He received the BE degree in Electrical Engineering from UEC in 1969, and the ME and Ph.D. degrees in Applied Physics from the University of Tokyo, respectively, in 1971 and 1974.

After working for Canon Inc., he joined the faculty of UEC in 1977. During 1985 he was a visiting scholar of Prof. Joseph W. Goodman’s Group at Stanford University. He retired from UEC and joined Utsunomiya University in 2012. In 2013-2014 he was a Humboldt Guest Professor at University of Stuttgart, Germany.

His technical activities and interest include:

1) Optical metrology, especially basic principles and industrial applications of optical interferometry and profilometry; Fringe analysis and image processing
2) Holography and its application to optical metrology and optical information processing
3) Statistical optics and imaging theory

His service to technical community includes:

1) President/Executive Director of the Optical Society of Japan, JSAP, 2010.4-2012.3
2) Board of Directors of Japan Society of Applied Physics, 1993-1995
3) Board of Directors of Optical Society of Japan, 1996-1997
4) Board of Directors of SPIE 2003, 2007-2009.
5) Associate Editor of Optical Review, 1994-2003
6) Asian Editor of Journal of Holography and Speckle, 2004-present.
7) Member of the Editorial Board of Industrial Metrology 1990-1993, Optics and Lasers in Engineering 1999-present, Chinese Optics 2010-present, Journal of the European Optical Society RP 2013-present.

Honors and recognition:

Dennis Gabor Award (SPIE), Humboldt Research Award (Alexander von Humboldt Foundation), Optics and Quantum Electronics Achievement Award (JSAP), Chandra S. Vikram Award (SPIE), Distinguished Alumni Award (UEC), SPIE Fellow, OSA Fellow, JSAP Fellow, a Member of International Order of Knights of Holography
Publications (104)

Proceedings Article | 5 November 2020 Paper
Proc. SPIE. 11567, AOPC 2020: Optical Sensing and Imaging Technology
KEYWORDS: Holography, Coherence (optics), Mechanics, Visualization, Kinematics, Photonics, Velocity measurements, Stochastic processes, Fluid dynamics, Radio propagation

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11548, Optical Design and Testing X
KEYWORDS: Polarization, Birefringence, Speckle, Scattering, Light scattering, Surface roughness, Wave plates, Diffusers, Spatial coherence, Stochastic processes

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11551, Holography, Diffractive Optics, and Applications X
KEYWORDS: Target detection, Biomedical optics, Coherence (optics), Polarization, Imaging systems, Diagnostics, Spectral resolution, Target recognition

Proceedings Article | 15 June 2020 Paper
Proc. SPIE. 11521, Biomedical Imaging and Sensing Conference 2020
KEYWORDS: Light sources, 3D image reconstruction, Digital holography, Tissues, Imaging systems, Scattering, Scattering media, Skin, Light scattering, Transmittance

Proceedings Article | 6 February 2020 Paper
Proc. SPIE. 11369, Fourteenth International Conference on Correlation Optics

Showing 5 of 104 publications
Proceedings Volume Editor (6)

SPIE Conference Volume | 10 September 2004

SPIE Conference Volume | 7 July 2000

SPIE Conference Volume | 13 August 1999

SPIE Conference Volume | 30 June 1998

SPIE Conference Volume | 17 July 1996

Showing 5 of 6 publications
Conference Committee Involvement (36)
Light in Nature VI
7 August 2017 | San Diego, California, United States
Holography: Advances and Modern Trends
24 April 2017 | Prague, Czech Republic
Holography: Advances and Modern Trends
15 April 2015 | Prague, Czech Republic
The Nature of Light: Light in Nature V
18 August 2014 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Showing 5 of 36 Conference Committees
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