Prof. Mohamed Amer
at National Institute for Standards
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2003 Paper
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Diffraction, Monochromatic aberrations, Metrology, Interferometers, Calibration, Error analysis, Distortion, Phase interferometry, Autocollimators, Fizeau interferometers

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