Prof. Mohamed Amer
at National Institute for Standards
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Autocollimators, Error analysis, Calibration, Diffraction, Metrology, Distortion, Interferometers, Monochromatic aberrations, Phase interferometry, Fizeau interferometers

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