CONFERENCE PROCEEDINGS
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Prof. Mohamed M. El-Gomati
at Univ of York
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 22 May 2009 Paper
Recent developments in the understanding and application of backscattered and secondary electrons in the SEM
M. M. El Gomati, C. G. H. Walker, J. A. D. Matthew
Proceedings Volume 7378, 73780Z (2009) https://doi.org/10.1117/12.821809
KEYWORDS: Electrons, Scattering, Transition metals, Copper, Metals, Ions, Scanning electron microscopy, Monte Carlo methods, Argon, Electron transport
Proceedings Article | 22 May 2009 Paper
The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM
M. El Gomati, F. Zaggout, C. Walker, X. Zha
Proceedings Volume 7378, 73780Y (2009) https://doi.org/10.1117/12.821810
KEYWORDS: Scanning electron microscopy, Electron beams, Semiconductors, Oxides, Silicon, Carbon, Oxygen, Ions, Molybdenum, Xenon
Proceedings Article | 4 September 2008 Paper
The application of carbon nanotube electron sources to the electron microscope
Mark Mann, Mohamed El Gomati, Torquil Wells, William Milne, Ken Teo
Proceedings Volume 7037, 70370P (2008) https://doi.org/10.1117/12.797289
KEYWORDS: Tungsten, Carbon nanotubes, Electron microscopes, Plasma enhanced chemical vapor deposition, Crystals, Electron beams, Photomicroscopy, Manufacturing, Image resolution, Microscopy
Proceedings Article | 15 November 1999 Paper
Fast parallel acquisition electron energy analyzer
Christopher Walker, Andrew Walker, Ranjan Badheka, Sumio Kumashiro, Marcus Jacka, Mohamed El Gomati, Martin Prutton, Frank Read
Proceedings Volume 3777, (1999) https://doi.org/10.1117/12.370135
KEYWORDS: Sensors, Electrodes, Photoemission spectroscopy, Data acquisition, Spectroscopes, Analytical research, Solids, X-rays, Spectroscopy, Mirrors
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