Mr. Mohamed Eldlio Profile

Mohamed Eldlio

at Dalhousie University

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 25 September 2014 Paper

Challenge of inhomogeneous waveguides analysis

T. Gric, M. Eldlio, M. Cada

Proceedings Volume 9288, 92880G (2014) https://doi.org/10.1117/12.2074676

KEYWORDS: Waveguides, Wave propagation, Analytical research, Physics, Dielectrics, Numerical analysis, Refractive index, Integrated optics, Radio propagation, Testing and analysis

Read Abstract +

Optical waveguides have been a subject of an intensive theoretical research, resulting in applications in several fields, and stimulated research in integrated optics. Homogeneous dielectric waveguides and their properties are covered in detail in many articles and textbooks. However, in waveguides loaded with arbitrary inhomogeneous dielectrics, analytical solutions are possible only for a limited number of permittivity profiles in simple geometries. The analysis of longitudinally inhomogeneous waveguides has been already proposed, but the main drawback of this approach is that it requires cumbersome and time-consuming integration. We therefore suggest to take this a step further by applying our new original analytical approach that does not require integration. The aim of this work is to establish a different method that is generally applicable to any vectorial time-dependent, anisotropic, non-linear, inhomogeneous, dissipative and dispersive media to analyze the field distribution of inhomogeneous 1-D and 2-D waveguides with symmetric and asymmetric permittivity profiles. Our initial consideration of slab problems with arbitrary profiles by means of analytical method shows a great deal of potential for use in applications in fields such as physics, and engineering.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years