Mohamed M. Saad
at Siemens EDA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 November 2007 Paper
Proceedings Volume 6730, 67304H (2007) https://doi.org/10.1117/12.746988
KEYWORDS: Metrology, Photomasks, Computer programming, Manufacturing, Interfaces, Manufacturing equipment, Databases, Visualization, Optical proximity correction, Data modeling

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