Dr. Mohan Vaidyanathan
at L3Harris Technologies Inc
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 14 May 2007 Paper
Mohan Vaidyanathan, Steven Blask, Thomas Higgins, William Clifton, Daniel Davidsohn, Ryan Carson, Van Reynolds, Joanne Pfannenstiel, Richard Cannata, Richard Marino, John Drover, Robert Hatch, David Schue, Robert Freehart, Greg Rowe, James Mooney, Carl Hart, Byron Stanley, Joseph McLaughlin, Eui-In Lee, Jack Berenholtz, Brian Aull, John Zayhowski, Alex Vasile, Prem Ramaswami, Kevin Ingersoll, Thomas Amoruso, Imran Khan, William Davis, Richard Heinrichs
Proceedings Volume 6550, 65500N (2007) https://doi.org/10.1117/12.722880
KEYWORDS: Sensors, LIDAR, 3D image processing, 3D acquisition, Target detection, Imaging systems, Image processing, Control systems, Image sensors, Data processing

Proceedings Article | 21 August 2003 Paper
Mohan Vaidyanathan, Song Xue, Kenneth Johnson, John Blackwell, Majid Zandian, Benji Hanyaloglu, Lester Kozlowski, Gary Hughes, John Montroy, Kadri Vural
Proceedings Volume 5086, (2003) https://doi.org/10.1117/12.487211
KEYWORDS: Staring arrays, LIDAR, Sensors, Short wave infrared radiation, Detector arrays, Readout integrated circuits, Indium gallium arsenide, Mid-IR, 3D image processing, Amplifiers

Proceedings Article | 19 September 2001 Paper
Kenneth Johnson, Mohan Vaidyanathan, Song Xue, William Tennant, Lester Kozlowski, Gary Hughes, Duane Smith
Proceedings Volume 4377, (2001) https://doi.org/10.1117/12.440097
KEYWORDS: Receivers, Sensors, LIDAR, Mercury cadmium telluride, Signal to noise ratio, Detector arrays, Staring arrays, Imaging devices, Indium gallium arsenide, Readout integrated circuits

Proceedings Article | 16 October 1998 Paper
Mohan Vaidyanathan, William Lynn, Wendy Shemano, Carl Schmidt, Paul McManamon
Proceedings Volume 3438, (1998) https://doi.org/10.1117/12.328108
KEYWORDS: Optical parametric oscillators, Reflectivity, Bidirectional reflectance transmission function, Calibration, Sensors, Polarization, Optical testing, Spectroscopy, Reflectometry, Nonlinear crystals

SPIE Journal Paper | 1 March 1998
OE, Vol. 37, Issue 03, (March 1998) https://doi.org/10.1117/12.10.1117/1.601907
KEYWORDS: Speckle, LIDAR, Sensors, Interference (communication), Reflectivity, Statistical analysis, Atmospheric modeling, Receivers, Multispectral imaging, Optical engineering

Showing 5 of 6 publications
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