Mohana K. Rajpalke
at
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Thin films, Luminescence, Crystals, X-ray diffraction, Silicon, Raman spectroscopy, Molecular beam epitaxy, Indium nitride, High temperature raman spectroscopy, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Reflection, Luminescence, X-ray diffraction, Platinum, Scanning electron microscopy, Gallium nitride, Sapphire, Diodes, Molecular beam epitaxy, Plasma

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