Monica Bollani
at L-NESS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 28, 2009
Proc. SPIE. 7364, Nanotechnology IV
KEYWORDS: Electron beam lithography, Germanium, Silicon, Atomic force microscopy, Quantum dots, Scanning electron microscopy, Photomasks, Plasma enhanced chemical vapor deposition, Reactive ion etching, Chemical elements

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top