Monisa Ramesh Babu
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12052, 1205210 (2022) https://doi.org/10.1117/12.2614185
KEYWORDS: Machine learning, Data modeling, Defect detection, Data analysis, Design for manufacturability, Yield improvement

Proceedings Article | 23 March 2020 Presentation + Paper
Monisa Ramesh Babu, Shenghua Song, Qian Xie, Pouya Rezaeifakhr, Eric Chiu, Joo Hyun Park, Deborah Ryan, Kiruthika Murali, Praneetha Poluju, Shobhit Malik, Haizhou Yin, Sriram Madhavan, Panneerselvam Venkatachalam
Proceedings Volume 11328, 113280H (2020) https://doi.org/10.1117/12.2551939
KEYWORDS: Inspection, Silicon, Machine learning, Databases, Scanning electron microscopy, Data modeling, Manufacturing, Data analysis, Analytics, Semiconducting wafers

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