Dr. Moshe Levy
Director at SCD Semiconductor Devices
Publications (16)

Proceedings Article | 17 November 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Contamination, High power lasers, Nitrogen, Reliability, Oxygen, Semiconductor lasers, Diodes, Astronomical imaging, Space operations, Single crystal X-ray diffraction

Proceedings Article | 4 March 2016
Proc. SPIE. 9733, High-Power Diode Laser Technology and Applications XIV
KEYWORDS: Diffraction, Holograms, High power lasers, Fiber lasers, Semiconductor lasers, Collimation, Diodes, Optical simulations, Fiber couplers, Optical pumping, Volume holography, Semiconducting wafers, Tolerancing, Fiber coupled lasers, Temperature metrology

Proceedings Article | 13 March 2015
Proc. SPIE. 9348, High-Power Diode Laser Technology and Applications XIII
KEYWORDS: Quantum wells, Reliability, Laser development, Fiber lasers, Semiconductor lasers, Diodes, Fiber couplers, Neon, Fiber coupled lasers, Single crystal X-ray diffraction

Proceedings Article | 20 February 2015
Proc. SPIE. 9346, Components and Packaging for Laser Systems
KEYWORDS: Thermography, Cladding, Sensors, Polymers, Fiber lasers, Semiconductor lasers, Optical simulations, Fiber couplers, Neon, Geometrical optics

Proceedings Article | 12 March 2014
Proc. SPIE. 8965, High-Power Diode Laser Technology and Applications XII
KEYWORDS: Continuous wave operation, Reliability, Fiber lasers, Semiconductor lasers, Diodes, Fiber couplers, Neon, Semiconducting wafers, Fiber coupled lasers

Proceedings Article | 4 March 2013
Proc. SPIE. 8640, Novel In-Plane Semiconductor Lasers XII
KEYWORDS: Mid-IR, Mirrors, FT-IR spectroscopy, Spectroscopy, Reliability, Laser development, Electroluminescence, Semiconductor lasers, Scanning electron microscopy, Laser ablation

Showing 5 of 16 publications
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