Prof. Moshe Sinvani
Associate Professor at Bar-Ilan Univ
SPIE Involvement:
Publications (11)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11267, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXV
KEYWORDS: Refractive index, Waveguides, Crystals, Silicon, Semiconductor lasers, Scanning electron microscopy, Refraction, Silicon photonics, Semiconducting wafers, Absorption

Proceedings Article | 21 February 2020 Paper
Proc. SPIE. 11254, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVII
KEYWORDS: Infrared imaging, Diffraction, Semiconductor lasers, Infrared lasers, Laser beam diagnostics

Proceedings Article | 5 March 2019 Paper
Proc. SPIE. 10891, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI
KEYWORDS: Diffraction, Point spread functions, Refractive index, Super resolution, Silicon, Beam shaping, Absorption

SPIE Journal Paper | 8 November 2018
OE Vol. 57 Issue 11
KEYWORDS: Silicon, Nanoparticles, Tunable filters, Fabry–Perot interferometers, Hyperspectral imaging, Optical filters, Spectral resolution, Refractive index, Near infrared, Optical engineering

Proceedings Article | 14 March 2018 Presentation
Proc. SPIE. 10479, Light-Based Diagnosis and Treatment of Infectious Diseases
KEYWORDS: Light sources, Imaging systems, Cameras, Remote sensing, Inflammation, Sensing systems, Light, Bacteria

Showing 5 of 11 publications
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