Prof. Motoharu Fujigaki
Professor at Univ of Fukui
SPIE Involvement:
Conference Program Committee | Author
Publications (34)

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Light sources, Phase shifting, Light emitting diodes, Cameras, Photography, 3D metrology, Projection systems, Measurement devices, Phase shifts, Diffraction gratings

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9204, Interferometry XVII: Advanced Applications
KEYWORDS: Optical fibers, Light sources, Light emitting diodes, Cameras, Calibration, Inspection, Head, 3D metrology, Phase shifts, Diffraction gratings

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Light sources, Phase shifting, Light emitting diodes, 3D metrology, Projection systems, Ronchi rulings, Shape analysis, Digital Light Processing, Phase shifts, Diffraction gratings

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8494, Interferometry XVI: Applications
KEYWORDS: Light sources, Moire patterns, Holograms, Optical sensors, 3D image reconstruction, Digital holography, Calibration, Imaging devices, Image sensors, Phase shifts

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8494, Interferometry XVI: Applications
KEYWORDS: CMOS sensors, Moire patterns, Fringe analysis, Cameras, Image processing, Interfaces, Field programmable gate arrays, Image analysis, Bridges, Phase shifts

SPIE Journal Paper | October 1, 2011
OE Vol. 50 Issue 10
KEYWORDS: Cameras, CCD cameras, Fringe analysis, Phase shifts, Shape analysis, 3D metrology, Optical engineering, Image processing, Phase measurement, 3D image processing

Showing 5 of 34 publications
Conference Committee Involvement (9)
Optical Technology and Measurement for Industrial Applications Conference
24 April 2019 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 9 published special sections
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