Prof. Motoharu Fujigaki
Professor at Univ of Fukui
SPIE Involvement:
Conference Program Committee | Author
Publications (35)

SPIE Journal Paper | 20 November 2018
OE Vol. 57 Issue 11
KEYWORDS: Digital holography, Phase shifts, Ferroelectric materials, Interferometry, Optical sensors, Mirrors, Head, 3D image reconstruction, Holographic interferometry, Holograms

Proceedings Article | 4 March 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Light sources, Phase shifting, Light emitting diodes, Cameras, Photography, 3D metrology, Projection systems, Measurement devices, Phase shifts, Diffraction gratings

Proceedings Article | 18 August 2014
Proc. SPIE. 9204, Interferometry XVII: Advanced Applications
KEYWORDS: Optical fibers, Light sources, Light emitting diodes, Cameras, Calibration, Inspection, Head, 3D metrology, Phase shifts, Diffraction gratings

Proceedings Article | 22 June 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Light sources, Phase shifting, Light emitting diodes, 3D metrology, Projection systems, Ronchi rulings, Shape analysis, Digital Light Processing, Phase shifts, Diffraction gratings

Proceedings Article | 13 September 2012
Proc. SPIE. 8494, Interferometry XVI: Applications
KEYWORDS: Light sources, Moire patterns, Holograms, Optical sensors, 3D image reconstruction, Digital holography, Calibration, Imaging devices, Image sensors, Phase shifts

Showing 5 of 35 publications
Conference Committee Involvement (11)
Dimensional Optical Metrology and Inspection for Practical Applications VIV
26 April 2020 | Anaheim, California, United States
Optical Technology and Measurement for Industrial Applications Conference
23 April 2020 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Showing 5 of 11 published special sections
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