Moydul Islam
at Micron Technology Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2019 Paper
Proceedings Volume 10962, 109620K (2019) https://doi.org/10.1117/12.2512567
KEYWORDS: Metals, Electroluminescence, Critical dimension metrology, Optical proximity correction, Optical lithography, Printing, Reticles, Finite element methods, Transition metals, Semiconducting wafers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top