Mr. Muhamad Asraf bin Ahmad Ibrahim Profile

Muhamad Asraf bin Ahmad Ibrahim

at Silterra Malaysia Sdn Bhd

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Author

Publications (3)

Proceedings Article | 26 May 2022 Poster + Paper

Pattern based automation of ETest gauge checks for MDP

Nur Ameera Ameelia Binti Iskandar Zulkarnain, Jason Sweis, Ezni Aznida Binti Kamal Baharin, Mohamad Fahmi bin Muhsain, Muhamad Asraf bin Ahmad Ibrahim, Muhamad Faiz bin Abd Malek

Proceedings Volume 12052, 1205215 (2022) https://doi.org/10.1117/12.2606175

KEYWORDS: Photomasks, Metrology, Wafer testing, Semiconductor manufacturing, Semiconducting wafers, Visualization, Target recognition, Pattern recognition, Optical inspection, Manufacturing

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Proceedings Article | 20 March 2018 Paper

Pattern-based IP block detection, verification, and variability analysis

Muhamad Asraf Bin Ahmad Ibrahim, Mohamad Fahmi Bin Muhsain, Ezni Aznida Binti Kamal Baharin, Jason Sweis, Ya-Chieh Lai, Philippe Hurat

Proceedings Volume 10588, 105880V (2018) https://doi.org/10.1117/12.2297675

KEYWORDS: Optical proximity correction, Databases, Silicon, System on a chip, Tolerancing, Legal, Integrated circuit design, Error analysis, Multilayers, Intellectual property

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Proceedings Article | 28 March 2017 Paper

A pattern-based method to automate mask inspection files

Ezni Aznida Binti Kamal Baharin, Mohamad Fahmi Bin Muhsain, Muhamad Asraf Bin Ahmad Ibrahim, Ahmad Nurul Ihsan Bin Ahmad Noorhani, Jason Sweis, Ya-Chieh Lai, Philippe Hurat

Proceedings Volume 10145, 101452Q (2017) https://doi.org/10.1117/12.2260976

KEYWORDS: Inspection, Metrology, Manufacturing, Pattern recognition, Mask making, Photomasks, Critical dimension metrology, Semiconducting wafers, Computer aided design

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