Muhamad Asraf Ahmad Ibrahim
at Silterra Malaysia Sdn Bhd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Multilayers, Databases, Error analysis, Silicon, Legal, Optical proximity correction, Tolerancing, Integrated circuit design, System on a chip, Intellectual property

Proceedings Article | 28 March 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Metrology, Pattern recognition, Manufacturing, Inspection, Photomasks, Mask making, Computer aided design, Critical dimension metrology, Semiconducting wafers

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