Mukesh Kumar
Scientist at CSIR - Central Scientific Instruments Organisation
SPIE Involvement:
Author
Area of Expertise:
Optical Thin Film Coatings , Optical Characterization , Light Analysis , Optical Coating Design
Publications (5)

SPIE Journal Paper | 27 June 2019
OE Vol. 58 Issue 06
KEYWORDS: Thin films, Refractive index, Coating, Silica, Image processing, Sapphire, Image quality, Data modeling, Thin film coatings, Statistical analysis

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Optical components, Refractive index, Antireflective coatings, Multilayers, Magnesium fluoride, Reflection, Glasses, Optical coatings, Thin film coatings, Zirconium dioxide

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Thin films, Apodization, Optical filters, Refractive index, Reflection, Digital filtering, Coating, Optical coatings, Reflectivity, Transmittance

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Diamond turning, X-ray optics, Diamond, Single point diamond turning, Spindles, Diamond machining, Silicon, Surface roughness, Radium, Surface finishing

Proceedings Article | 15 June 2015
Proc. SPIE. 9654, International Conference on Optics and Photonics 2015
KEYWORDS: Thin films, Optical filters, Electron beams, Light sources, Reflection, Glasses, Dielectrics, Reflectivity, Chemical vapor deposition, Thin film coatings

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