Dr. Mukti M. Rana
at Delaware State Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10381, Wide Bandgap Power Devices and Applications II
KEYWORDS: Aluminum, Thin films, Refractive index, pyroelectric detectors, Polarization, Scanning electron microscopy, Temperature metrology, Capacitors, Sputter deposition, Transmittance

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Microbolometers, Bolometers, Infrared radiation, Thin films, Semiconductors, Silicon films

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: pyroelectric detectors, Pyroelectricity, Crystals, Sputter deposition, Temperature metrology

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: pyroelectric detectors, Infrared detection, Infrared sensors, Aluminum nitride, Aluminum, Sputter deposition, Temperature metrology, Silicon, Dielectric polarization

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Sensors, pyroelectric detectors, Electrodes, Thermal effects, Thermal sensing, Infrared detectors, Thermography, Infrared radiation, Temperature metrology, Photodetectors

Conference Committee Involvement (1)
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
15 April 2018 | Orlando, Florida, United States
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