Dr. Muralidhara Subbarao
at Stony Brook Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (34)

Proceedings Article | 14 September 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Signal to noise ratio, Point spread functions, Cameras, Image processing, Image restoration, Image analysis, Inverse problems, Convolution, Algorithm development, Iterative methods

Proceedings Article | 8 September 2010
Proc. SPIE. 7798, Applications of Digital Image Processing XXXIII
KEYWORDS: Point spread functions, Optical spheres, Cameras, Video, Computer simulations, 3D modeling, Monte Carlo methods, Motion models, Spherical lenses, 3D image processing

Proceedings Article | 8 September 2010
Proc. SPIE. 7798, Applications of Digital Image Processing XXXIII
KEYWORDS: Point spread functions, Cameras, Image segmentation, Matrices, Image processing, Computer simulations, Convolution, Algorithm development, Process modeling, Algorithms

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mirrors, Imaging systems, Cameras, Calibration, Matrices, Digital cameras, Distortion, 3D modeling, Image sensors, Stereoscopic cameras

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mathematical modeling, Point spread functions, Cameras, Reliability, Inspection, Image restoration, Image analysis, Machine vision, Image filtering, Deconvolution

Proceedings Article | 29 August 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Point spread functions, Cameras, Calibration, Digital cameras, Image analysis, Deconvolution, Convolution, Scanning tunneling microscopy, Ranging, Algorithms

Showing 5 of 34 publications
Conference Committee Involvement (2)
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology VI
10 August 2008 | San Diego, California, United States
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