Mykola Guryev
at Kharkiv Scientific Institute
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 4, 2003
Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
KEYWORDS: Polarization, Reflection, Calibration, Quantum efficiency, Lamps, Reflectivity, Photodiodes, Image registration, Picosecond phenomena, Monochromators

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