This paper reported the simple nanorod characteristic measurement method by layer separated structure. The structures
are designed by the ANSYS simulation and they are fabricated by semiconductor fabrications. In the experiment,
dielectrophoresis (DEP) principle is used to assemble nanorods which are synthesized by electrochemical deposition
(ECD) method. However, it is difficult to make devices without assembly process because nanorods which are
synthesized by the ECD method are dispersed in the medium. Therefore, this paper was studied to design and fabricate
the nanorod assembly-layer and measurement-layer separation. After assembling the nanorods, I-V characteristics of the
nanorods were measured.