Dr. Myun-Sik Kim
Senior Scientist at Ecole Polytechnique Fédérale de Lausanne
SPIE Involvement:
Senior status | Author
Area of Expertise:
High-resolution interference microscope (HRIM) , Interferometry , Talbot effect and Self-imaging effect , Micro-optics / Diffraction gratings , Solid immersion lens (SIL) , Photonic Nanojet
Websites:
Profile Summary

Myun-Sik Kim received a Master degree on Mechatronics from Gwangju Institute of Science and Technology (GIST), Korea in 2004 and a PhD in Photonics from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2011.
Since August 2012, he works at SUSS MicroOptics SA (Hauterive, Switzerland) as Head of Metrology team. SUSS MicroOptics is a world’s leading manufacturer of microlenses and microlens arrays. He is a senior member of the SPIE, and a member of the OSA (Optical society of America), EOS (European Optical Society), and OSK (Optical Society of Korea).

His expertise is “interferometry and metrology” and his research interests include interdisciplinary subjects in micro- and nano-fabrication and photonic systems.

He is the author of a book chapter edited by Prof. Emil Wolf, Progress in Optics volume 58, 2013, 25 peer-reviewed internal journals, 20 SPIE proceedings, and numerous conference presentations.


Research interests
1. Micro- and nano-fabrication technologies.
2. Sufrace electromagnetic wave systems
• Bloch surface wave
3. High-resolution optical metrology
• Optical microscopy
• Optical interferometry
• Phase shifting interferometry (PSI)
• High-resolution interference microscope
• Longitudinal-differencial interferometer
• Optical shop testing for wavelength-sclae optical elements
4. Wavelength-scale physical optics
• Refraction: high NA focused beams
• Diffraction by a single object: the spot of Arago / Babinet’s principle
• Diffraction by a periodic object (gratings): Talbot and Lau effects
• Scattering by a single dielectric sphere: Photonic nanojet
• Solid immersion lens (SIL) from macro-size down to subwavelength-size
• Plasmonic nanostructures: polarimetry or light confinements
• Axial phase shifts and evolutions: Gouy phase anomaly
• Complex light and structured beams: Laguerre-Gauss, Bessel, Mathieu, cosine beams
Publications (24)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10544, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI

PROCEEDINGS ARTICLE | January 2, 2018
Proc. SPIE. 10456, Nanophotonics Australasia 2017
KEYWORDS: Optical components, Diffraction, Dielectrics, Near field scanning optical microscopy, Near field, Photonics, Nondiffracting beams, Diffraction gratings

PROCEEDINGS ARTICLE | February 27, 2017
Proc. SPIE. 10120, Complex Light and Optical Forces XI
KEYWORDS: Diffraction, Modulation, Polarization, Interferometry, Electromagnetic radiation, Computer simulations, Near field, Distance measurement, Near field diffraction, Objectives, Singular optics, Electromagnetism, Nanofabrication, Radio propagation, Diffraction gratings

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10116, MOEMS and Miniaturized Systems XVI
KEYWORDS: Microelectromechanical systems, Optical components, Diffraction, Optical spheres, Scattering, Lenses, Glasses, Near field, Refraction, Photonics, Micro optics, Microlens, Geometrical optics

PROCEEDINGS ARTICLE | February 16, 2017
Proc. SPIE. 10106, Integrated Optics: Devices, Materials, and Technologies XXI
KEYWORDS: Optical components, Nanostructures, Prisms, Multilayers, Finite-difference time-domain method, Axicons, Resonators, Dielectrics, Optical microscopy, Near field scanning optical microscopy, Near field, Heterodyning, Photonics, Integrated optics, Dielectric polarization, Near field optics

PROCEEDINGS ARTICLE | November 8, 2016
Proc. SPIE. 9919, Nanophotonic Materials XIII
KEYWORDS: Surface plasmon polaritons, Finite-difference time-domain method, Silica, Dielectrics, Interfaces, Photonic crystals, Integrated optics, Electromagnetism, Radio propagation, Dielectric polarization

Showing 5 of 24 publications
Conference Committee Involvement (1)
Frontiers in Optics (FIO) 2011
16 October 2011 |
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top