Dr. Myun-Sik Kim
Product Manager at Axetris AG
SPIE Involvement:
Author
Area of Expertise:
High-resolution interference microscope (HRIM) , Interferometry , Talbot effect and Self-imaging effect , Micro-optics / Diffraction gratings , Solid immersion lens (SIL) , Photonic Nanojet
Websites:
Profile Summary

Myun-Sik Kim received a Master degree on Mechatronics from Gwangju Institute of Science and Technology (GIST), Korea in 2004 and a PhD in Photonics from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2011.
Since January 2019, he works at Axetris AG (Switzerland) as Senior Application Engineer. Axetris is a world’s leading manufacturer of microlenses and Micro-Optics. He is a senior member of the SPIE, and a member of the OSA (Optical society of America), EOS (European Optical Society), and OSK (Optical Society of Korea).

His expertise is “interferometry and metrology” and his research interests include interdisciplinary subjects in micro- and nano-fabrication and photonic systems.

He is the author of a book chapter edited by Prof. Emil Wolf, Progress in Optics volume 58, 2013, 25 peer-reviewed internal journals, 20 SPIE proceedings, and numerous conference presentations.


Research interests
1. Micro- and nano-fabrication technologies.
2. Sufrace electromagnetic wave systems
• Bloch surface wave
3. High-resolution optical metrology
• Optical microscopy
• Optical interferometry
• Phase shifting interferometry (PSI)
• High-resolution interference microscope
• Longitudinal-differencial interferometer
• Optical shop testing for wavelength-sclae optical elements
4. Wavelength-scale physical optics
• Refraction: high NA focused beams
• Diffraction by a single object: the spot of Arago / Babinet’s principle
• Diffraction by a periodic object (gratings): Talbot and Lau effects
• Scattering by a single dielectric sphere: Photonic nanojet
• Solid immersion lens (SIL) from macro-size down to subwavelength-size
• Plasmonic nanostructures: polarimetry or light confinements
• Axial phase shifts and evolutions: Gouy phase anomaly
• Complex light and structured beams: Laguerre-Gauss, Bessel, Mathieu, cosine beams
Publications (26)

Proceedings Article | 4 March 2019
Proc. SPIE. 10930, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XII
KEYWORDS: Microscopes, Optical spheres, Imaging systems, Magnetism, Image resolution, Colorimetry, Wave propagation, Objectives, Phase measurement, Photonic nanostructures

Proceedings Article | 27 February 2019
Proc. SPIE. 10914, Optical Components and Materials XVI
KEYWORDS: Microscopes, Diffraction, Metrology, Diffractive optical elements, Silica, Photonics, Objectives, Spectral resolution, Phase measurement, Spiral phase plates

Proceedings Article | 14 March 2018
Proc. SPIE. 10544, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI

Proceedings Article | 2 January 2018
Proc. SPIE. 10456, Nanophotonics Australasia 2017
KEYWORDS: Optical components, Diffraction, Dielectrics, Near field scanning optical microscopy, Near field, Photonics, Nondiffracting beams, Diffraction gratings

Proceedings Article | 27 February 2017
Proc. SPIE. 10120, Complex Light and Optical Forces XI
KEYWORDS: Diffraction, Modulation, Polarization, Interferometry, Electromagnetic radiation, Computer simulations, Near field, Distance measurement, Near field diffraction, Objectives, Singular optics, Electromagnetism, Nanofabrication, Radio propagation, Diffraction gratings

Showing 5 of 26 publications
Conference Committee Involvement (1)
Frontiers in Optics (FIO) 2011
16 October 2011 |
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