Nader M. Hindawy
at Mentor Graphics Egypt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2009
Proc. SPIE. 7275, Design for Manufacturability through Design-Process Integration III
KEYWORDS: Wafer-level optics, Lithography, Data modeling, Visualization, Databases, Photomasks, Optical proximity correction, SRAF, Semiconducting wafers, Electronic design automation

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