Nadia A. Zatsepin
at Monash Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Statistical analysis, Sensors, Nanoparticles, Particles, Crystals, X-rays, X-ray diffraction, Transmission electron microscopy, Aluminum, Monochromators

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Diffraction, Scattering, Sensors, Nanoparticles, Particles, Crystals, X-rays, X-ray diffraction, Transmission electron microscopy, Spatial resolution

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